Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175220 | Surface defect measuring apparatus and method by microscopic scattering polarization imaging | Jianda Shao, Shijie Liu, Kaizao Ni, You Zhou, Weiwei WANG +2 more | 2021-11-16 |
| 10969348 | Device and method for measuring in-situ time-resolved X-ray absorption spectrum | Jianda Shao, Shijie Liu | 2021-04-06 |