Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11099294 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Jeffrey Bryan Abel, Joseph Bendahan | 2021-08-24 | $8,261,000 |