Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11099294 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2021-08-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11099294 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2021-08-24 |