YK

Yutaka Kato

OM Omron: 9 patents #9 of 405Top 3%
MC Max Co.: 1 patents #17 of 49Top 35%
Overall (2021): #7,273 of 548,734Top 2%
10
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11084153 Stapler Hiroaki Takahashi 2021-08-10
11080843 Image inspecting apparatus, image inspecting method and image inspecting program Shingo Inazumi 2021-08-03
11080836 Appearance inspection system, image processing device, imaging device, and inspection method Yasuhito Uetsuji 2021-08-03
11022560 Image inspection device 2021-06-01
10984516 Image inspection device and illumination device 2021-04-20
10984515 Image inspection device and illumination device 2021-04-20
10939024 Image processing system, image processing device and image processing program for image measurement 2021-03-02
10909672 Appearance inspection system, image processing device, setting device, and inspection method Shingo Inazumi, Naoya Nakashita 2021-02-02
10896499 Image processing system, image processing device and image processing program 2021-01-19
10887506 Image inspection device, image inspection method and computer readable recording medium 2021-01-05