Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11157797 | Evaluating quality of a product such as a semiconductor substrate | Hiroshi Sugahara | 2021-10-26 |
| 11106507 | Management apparatus, management system, management method, and management program | Yusuke Yamaji, Takayuki Eda, Hiroshi Imai, Tetsuji Yamato, Koji Takizawa | 2021-08-31 |
| 11087498 | Image processing system, optical sensor, and learning apparatus with irregular lens array | — | 2021-08-10 |
| 11042149 | Monitoring devices, monitored control systems and methods for programming such devices and systems | — | 2021-06-22 |
| 11036965 | Shape estimating apparatus | — | 2021-06-15 |