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TAL ZAHARONI

NI Nova Measuring Instruments: 1 patents #4 of 42Top 10%
Overall (2021): #238,499 of 548,734Top 45%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17