{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "2021", "item": "https://www.patentleaderboard.com/2021/"}, {"@type": "ListItem", "position": 3, "name": "Nova", "item": "https://www.patentleaderboard.com/2021/company/nova"}, {"@type": "ListItem", "position": 4, "name": "Shay Yogev", "item": "https://www.patentleaderboard.com/2021/inventor/fl:sh_ln:yogev-1"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Shay Yogev — 2 Patents in 2021

NONova: 1 patents #1 of 6Top 20%
NINova Measuring Instruments: 1 patents #4 of 42Top 10%
Kfar Menahem, IL: #2 of 2 inventorsTop 100%
Overall (2021): #111,785 of 548,734Top 25%
2 Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11107738 Layer detection for high aspect ratio etch control Gil Loewenthal, Yoav Etzioni 2021-08-31
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17 $19,081,000