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EYLON RABINOVICH — 1 Patent in 2021

NINova Measuring Instruments: 1 patents #4 of 42Top 10%
Overall (2021): #459,646 of 548,734Top 85%
1 Patents 2021

Issued Patents 2021

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17

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