Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183377 | Mass spectrometer detector and system and method using the same | Christopher F. Bevis, Yungman Alan Liu, Eli Cheifetz, Amit Weingarten, Alexander Kadyshevitch | 2021-11-23 |
| 10910208 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt, Chris Bevis | 2021-02-02 |