Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10910208 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2021-02-02 | $15,872,000 |