Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10983478 | Complex defect diffraction model and method for defect inspection of transparent substrate | Chau-Jern Cheng, Han-Yen Tu, Yu-Chih Lin | 2021-04-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10983478 | Complex defect diffraction model and method for defect inspection of transparent substrate | Chau-Jern Cheng, Han-Yen Tu, Yu-Chih Lin | 2021-04-20 |