Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10983478 | Complex defect diffraction model and method for defect inspection of transparent substrate | Han-Yen Tu, Kuang-Che Chang Chien, Yu-Chih Lin | 2021-04-20 |
| 10976152 | Method for defect inspection of transparent substrate by integrating interference and wavefront recording to reconstruct defect complex images information | Chin-Yu Liu, Xin LAI | 2021-04-13 |