JP

John B. Putman

NI Nanotronics Imaging: 13 patents #2 of 25Top 8%
Overall (2021): #4,800 of 548,734Top 1%
13
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11156992 Predictive process control for a manufacturing process Matthew C. Putman, Vadim Pinskiy, Damas Limoge 2021-10-26
11156991 Predictive process control for a manufacturing process Matthew C. Putman, Vadim Pinskiy, Damas Limoge 2021-10-26
11125677 Systems, devices, and methods for combined wafer and photomask inspection Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton +1 more 2021-09-21
11117328 Systems, methods, and media for manufacturing processes Fabian Hough, Matthew C. Putman, Vadim Pinskiy, Damas Limoge, Aswin Raghav Nirmaleswaran +1 more 2021-09-14
11099368 Camera and specimen alignment to facilitate large area imaging in microscopy Matthew C. Putman, Brandon Scott, Dylan Fashbaugh 2021-08-24
11100221 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, Vadim Pinskiy, Damas Limoge, Andrew Sundstrom, James Williams, III 2021-08-24
11086988 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data Matthew C. Putman, Vadim Pinskiy, Andrew Sundstrom, James Williams, III 2021-08-10
11063965 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, Vadim Pinskiy, Damas Limoge, Andrew Sundstrom, James Williams, III 2021-07-13
10970831 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, Vadim Pinskiy, Joseph Succar 2021-04-06
10955651 Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto Matthew C. Putman, Julie Orlando, Jospeh G. Bulman 2021-03-23
10915992 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more 2021-02-09
10914686 Macro inspection systems, apparatus and methods Matthew C. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more 2021-02-09
10901521 Apparatus and method for manipulating objects with gesture controls Matthew C. Putman, Paul Roossin 2021-01-26