Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10976363 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Guan-Jhih Liou | 2021-04-13 |
| 10895587 | Wafer probe station | Jhih-Wei Fang, Stojan Kanev, Sebastian Giessmann | 2021-01-19 |