Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11185925 | Process abnormality detection system for three-dimensional additive manufacturing device, three-dimensional additive manufacturing device, process abnormality detection method for three-dimensional additive manufacturing device, method for manufacturing three-dimensional additive manufactured product, and three-dimensional additive manufactured product | Ryuichi Narita, Toshiya Watanabe, Akio Kondou, Masashi Kitamura, Shuji TANIGAWA +3 more | 2021-11-30 |