Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11185925 | Process abnormality detection system for three-dimensional additive manufacturing device, three-dimensional additive manufacturing device, process abnormality detection method for three-dimensional additive manufacturing device, method for manufacturing three-dimensional additive manufactured product, and three-dimensional additive manufactured product | Ryuichi Narita, Toshiya Watanabe, Masashi Kitamura, Hidetaka Haraguchi, Shuji TANIGAWA +3 more | 2021-11-30 |
| 11073378 | Clearance measurement device, clearance measurement sensor, and clearance measurement method | Misaki Fukuyama, Tomoyuki Onishi, Takahiro Miyamoto | 2021-07-27 |