Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11189536 | Method and apparatus for on-chip stress detection | Kenneth W. Marr, Michele Piccardi, Marco-Domenico Tiburzi, Eric H. Freeman, Joshua Daniel Tomayer | 2021-11-30 |
| 11170860 | Memory device and method of performing erase and erase verify operations | Fulvio Rori | 2021-11-09 |
| 11132247 | Selective bad block untag and bad block reuse | Fulvio Rori, Scott Anthony Stoller | 2021-09-28 |
| 11061606 | NAND temperature-aware operations | Fulvio Rori, Jonathan W. Oh, Giuseppe Cariello | 2021-07-13 |
| 10884638 | Programmable peak power management | Giuseppe Cariello, Marco-Domenico Tiburzi, Fulvio Rori | 2021-01-05 |