RW

Robert Wagner

MI Micro-Epsilon-Messtechnik: 2 patents #1 of 13Top 8%
📍 Fort Wayne, IN: #17 of 126 inventorsTop 15%
🗺 Indiana: #553 of 3,792 inventorsTop 15%
Overall (2021): #117,749 of 548,734Top 25%
2
Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11125550 Method and device for optically measuring the surface of a measurement object Hannes LOFERER, Reiner KICKINGEREDER, Josef Reitberger, Rainer Hesse 2021-09-21
11092432 Reference plate and method for calibrating and/or checking a deflectometry sensor system Stephan Zweckinger, Josef Hochleitner, Hannes LOFERER, Rainer Hesse 2021-08-17