RH

Rainer Hesse

MI Micro-Epsilon-Messtechnik: 2 patents #1 of 13Top 8%
📍 Ortenburg, DE: #2 of 7 inventorsTop 30%
Overall (2021): #121,138 of 548,734Top 25%
2
Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11125550 Method and device for optically measuring the surface of a measurement object Hannes LOFERER, Reiner KICKINGEREDER, Josef Reitberger, Robert Wagner 2021-09-21
11092432 Reference plate and method for calibrating and/or checking a deflectometry sensor system Stephan Zweckinger, Josef Hochleitner, Hannes LOFERER, Robert Wagner 2021-08-17