Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11035666 | Inspection-guided critical site selection for critical dimension measurement | Jagdish Chandra Saraswatula, Arpit Yati | 2021-06-15 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11035666 | Inspection-guided critical site selection for critical dimension measurement | Jagdish Chandra Saraswatula, Arpit Yati | 2021-06-15 |