Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125775 | Probe and manufacturing method of probe for scanning probe microscope | Mitsuo Koike, Masumi Saitoh | 2021-09-21 |
| 11069513 | Charged particle beam apparatus | Mitsuo Koike | 2021-07-20 |
SL
See Kei Lee
Overall (2021): #114,328 of 548,734Top 25%
2
Patents 2021