Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125775 | Probe and manufacturing method of probe for scanning probe microscope | See Kei Lee, Masumi Saitoh | 2021-09-21 |
| 11069513 | Charged particle beam apparatus | See Kei Lee | 2021-07-20 |