Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11031208 | Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope | — | 2021-06-08 |
| 10886099 | Method of aberration measurement and electron microscope | Akiho Nakamura | 2021-01-05 |