Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923314 | Method of image acquisition and electron microscope | — | 2021-02-16 |
| 10886099 | Method of aberration measurement and electron microscope | Yuji Kohno | 2021-01-05 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923314 | Method of image acquisition and electron microscope | — | 2021-02-16 |
| 10886099 | Method of aberration measurement and electron microscope | Yuji Kohno | 2021-01-05 |