Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11163003 | Electronic device test database generating method and electronic device test database generating apparatus | Po-Lin Chen, Chia-Tso Chao, Tse-Wei Wu | 2021-11-02 |
| 11073555 | Circuit testing system and circuit testing method | Jeong-Fa Sheu, Chia-Jui Yang, Po-Lin Chen | 2021-07-27 |
| 11073558 | Circuit having multiple scan modes for testing | Tzung-Jin Wu, Jeong-Fa Sheu, Po-Lin Chen, Yin-Ping Chern | 2021-07-27 |
| 11061073 | Circuit testing system and circuit testing method | Jeong-Fa Sheu, Chia-Jui Yang, Po-Lin Chen | 2021-07-13 |