Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11163003 | Electronic device test database generating method and electronic device test database generating apparatus | Ying-Yen Chen, Chia-Tso Chao, Tse-Wei Wu | 2021-11-02 |
| 11116082 | Insulation protection structure | Hung-Chieh Chin, Hung Chien Lee, Feng Ju Li, Dong-Sheng Xie, Gang Wu | 2021-09-07 |
| 11073555 | Circuit testing system and circuit testing method | Ying-Yen Chen, Jeong-Fa Sheu, Chia-Jui Yang | 2021-07-27 |
| 11073558 | Circuit having multiple scan modes for testing | Tzung-Jin Wu, Jeong-Fa Sheu, Yin-Ping Chern, Ying-Yen Chen | 2021-07-27 |
| 11061073 | Circuit testing system and circuit testing method | Ying-Yen Chen, Jeong-Fa Sheu, Chia-Jui Yang | 2021-07-13 |
| 10971502 | SRAM structure | Chien Hui HUANG, Tsung-Hsun Wu | 2021-04-06 |