Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11107738 | Layer detection for high aspect ratio etch control | Gil Loewenthal, Yoav Etzioni | 2021-08-31 |
| 11093840 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2021-08-17 |