Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125677 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Steve Scranton, Alejandro S. Jaime +1 more | 2021-09-21 |
| 10914686 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |
| 10915992 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |