Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175589 | Automatic wavelength or angle pruning for optical metrology | Lie-Quan Lee | 2021-11-16 |
| 10895810 | Automatic selection of sample values for optical metrology | Meng Cao, Inkyo Kim, Lie-Quan Lee | 2021-01-19 |