Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175589 | Automatic wavelength or angle pruning for optical metrology | Leonid Poslavsky | 2021-11-16 |
| 10895810 | Automatic selection of sample values for optical metrology | Meng Cao, Leonid Poslavsky, Inkyo Kim | 2021-01-19 |