Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054463 | Method and system for measuring thermal stability factor of magnetic tunnel junction device, semiconductor integrated circuit, and production management method for semiconductor integrated circuit | Tetsuo Endoh, Hideo Sato, Takashi Saito, Masakazu Muraguchi, Hideo Ohno | 2021-07-06 |