Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11073538 | Electrical testing apparatus with lateral movement of a probe support substrate | Paul Diglio | 2021-07-27 |
| 10935573 | Slip-plane MEMS probe for high-density and fine pitch interconnects | Pooya Tadayon | 2021-03-02 |