Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10914686 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |
| 10915992 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |