Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10921371 | Programmable scan shift testing | Aniruddha M. Bhasale | 2021-02-16 |
| 10921372 | Rapid scan testing of integrated circuit chips | Rajesh Maruti Bhagwat, Nitin Satishchandra Kabra | 2021-02-16 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10921371 | Programmable scan shift testing | Aniruddha M. Bhasale | 2021-02-16 |
| 10921372 | Rapid scan testing of integrated circuit chips | Rajesh Maruti Bhagwat, Nitin Satishchandra Kabra | 2021-02-16 |