Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10921372 | Rapid scan testing of integrated circuit chips | Rajesh Maruti Bhagwat, Jay Shah | 2021-02-16 |
| 10915262 | Hybrid storage device partitions with storage tiers | Rajesh Maruti Bhagwat, Nilesh Govande, Manish Sharma, Joe Paul Moolanmoozha, Alexander C. Worrall | 2021-02-09 |