JH

Jan Hradil

FE Fei: 1 patents #30 of 110Top 30%
Overall (2021): #418,947 of 548,734Top 80%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11002692 Method of examining a sample using a charged particle microscope Tomas Tuma, Petr Hlavenka 2021-05-11