Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11002692 | Method of examining a sample using a charged particle microscope | Tomas Tuma, Jan Hradil | 2021-05-11 |
| 10937627 | Multi-beam electron microscope | Pavel Stejskal, Bohuslav Sed'a | 2021-03-02 |