DT

Daniel Totonjian

FE Fei: 1 patents #30 of 110Top 30%
Overall (2021): #478,336 of 548,734Top 90%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11152189 Method and system for plasma assisted low vacuum charged-particle microscopy James Bishop, Chris Elbadawi, Charlene Lobo, Milos Toth 2021-10-19