Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11169000 | Multi-turn measurement system | Armin Meisenberg, Scott Yankie | 2021-11-09 |
| 11152189 | Method and system for plasma assisted low vacuum charged-particle microscopy | Daniel Totonjian, Chris Elbadawi, Charlene Lobo, Milos Toth | 2021-10-19 |