Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199508 | Failure analysis method with improved detection accuracy for advanced technology node | Tsung-Yang Hung, Ming-Yih Wang | 2021-12-14 |
| 11029331 | Universal test mechanism for semiconductor device | Mill-Jer Wang, Hung-Chih Lin, Hao Chen | 2021-06-08 |