Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11107658 | Fill pattern to enhance e-beam process margin | Shakul Tandon, Mark C. Phillips, Shem Ogadhoh | 2021-08-31 |
| 11010525 | Fast pattern matching | Bikram Baidya, Prasad N. Atkar, Vivek Singh, Aswin Sreedhar | 2021-05-18 |
| 10885259 | Random forest model for prediction of chip layout attributes | Bikram Baidya, Kumara Sastry, Prasad N. Atkar, Vivek Singh | 2021-01-05 |