Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11047792 | Semiconductor device inspection method and semiconductor device inspection apparatus | Tomonori Nakamura | 2021-06-29 |
| 11009531 | Image generating method, image generating device, image generating program, and storage medium | Tomonori Nakamura | 2021-05-18 |