JR

JaeWoo Ryu

GC Globalwafers Co.: 2 patents #14 of 81Top 20%
Overall (2021): #151,964 of 548,734Top 30%
2
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11047066 Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots Carissima Marie Hudson 2021-06-29
10954606 Methods for modeling the impurity concentration of a single crystal silicon ingot Carissima Marie Hudson 2021-03-23