| #153 |
Michael J. Jordan |
IBM |
1 |
| #153 |
Kevin D. McKenzie |
IBM |
1 |
| #153 |
Peter C. Elmendorf |
IBM |
1 |
| #153 |
Anson J. Call |
IBM |
1 |
| #153 |
Albert Y. Zhu |
— |
1 |
| #153 |
Mario M. Pelella |
AMD |
1 |
| #153 |
Steven P. Ostrander |
IBM |
1 |
| #153 |
Mustafa Y. Mah |
IBM |
1 |
| #153 |
Asmahan Ali |
IBM |
1 |
| #153 |
Sean P. O'Donnell |
Dell Products |
1 |
| #153 |
Daniela Yaniv |
IBM |
1 |
| #153 |
Mark Klare |
Nova Measuring Instruments |
1 |
| #153 |
John E. Drummond |
IBM |
1 |
| #153 |
Frank Hemsing |
IBM |
1 |
| #153 |
Claudius Feger |
IBM |
1 |
| #153 |
Hung H. Tran |
IBM |
1 |
| #153 |
Yuen H. Chan |
IBM |
1 |
| #153 |
William C. Neiman |
IBM |
1 |
| #153 |
Nany Kollesar |
IBM |
1 |
| #153 |
Tri M. Hoang |
IBM |
1 |
| #153 |
Jose R. D. Coronel |
IBM |
1 |
| #153 |
Victoria A. Nwobodo |
IBM |
1 |
| #153 |
Kathleen Ann Fadden |
IBM |
1 |
| #153 |
Miguel E. Perez |
IBM |
1 |
| #153 |
Susan Shumway |
IBM |
1 |
| #153 |
Denis S. Barry |
— |
1 |
| #153 |
Lawrence Zaino |
University Of Notre Dame Du Lac |
1 |
| #153 |
Charles L. Carpenter |
IBM |
1 |
| #153 |
Charles W. Calio |
IBM |
1 |
| #153 |
Christian Wilhelmus Baks |
IBM |
1 |
| #153 |
Paul Jacob Logsdon |
IBM |
1 |
| #153 |
Madhana Sunder |
IBM |
1 |
| #153 |
Bishan He |
IBM |
1 |
| #153 |
Allan C. VanDeventer |
IBM |
1 |
| #153 |
Phil C. Yeh |
IBM |
1 |
| #153 |
Mark A. Lehrer |
IBM |
1 |
| #153 |
Kershaw S. Mehta |
IBM |
1 |
| #153 |
Michael Kane |
IBM |
1 |
| #153 |
Shao-fu Sanford Chu |
Chartered Semiconductor Manufacturing |
1 |
| #153 |
Chris Aaron Cavitt |
IBM |
1 |
| #153 |
Nicholas Ziemis |
IBM |
1 |
| #153 |
Lucas Dane LaLima |
IBM |
1 |
| #153 |
Viraj Y. Sardesai |
IBM |
1 |
| #153 |
Paul Taukatch |
IBM |
1 |
| #153 |
Cresyi Padilla-Ruberte |
IBM |
1 |
| #153 |
Jeffrey P. Soreff |
IBM |
1 |
| #153 |
Yi Pan |
IBM |
1 |
| #153 |
Stephanie Lehrer |
IBM |
1 |
| #153 |
Maurice M. Materise |
IBM |
1 |
| #153 |
Joel Matthew Moss |
IBM |
1 |