Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11126172 | Methods and systems for applying run-to-run control and virtual metrology to reduce equipment recovery time | Jianping Zou, Parris Hawkins, James Moyne | 2021-09-21 |
| 11054815 | Apparatus for cost-effective conversion of unsupervised fault detection (FD) system to supervised FD system | Bradley D. Schulze, Suketu Arun Parikh, Jigar Bhadriklal Patel | 2021-07-06 |
| 11022968 | Methods and systems for applying run-to-run control and virtual metrology to reduce equipment recovery time | Jianping Zou, Parris Hawkins, James Moyne | 2021-06-01 |
| 10901407 | Semiconductor device search and classification | Michael D. Armacost, Heng HAO | 2021-01-26 |
| 10884400 | Matching process controllers for improved matching of process | James Moyne | 2021-01-05 |