Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11029253 | Computerized method for configuring an inspection system, computer program product and an inspection system | Amir Shoham, Yariv Simovitch | 2021-06-08 |
| 10928739 | Method of measuring misregistration of semiconductor devices | Roie Volkovich | 2021-02-23 |