Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840092 | Atomic force microscopy based on nanowire tips for high aspect ratio nanoscale metrology/confocal microscopy | Steven R. J. Brueck, Daniel F. Feezell, Mahmoud Behzadirad | 2020-11-17 |