KN

Kenichi Narikawa

TL Tokyo Electron Limited: 1 patents #306 of 858Top 40%
Overall (2020): #390,298 of 565,922Top 70%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10859601 Device inspection circuit, device inspection device, and probe card — 2020-12-08