Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10753972 | Wafer inspection system, wafer inspection apparatus and prober | Shigekazu Komatsu, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2020-08-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10753972 | Wafer inspection system, wafer inspection apparatus and prober | Shigekazu Komatsu, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2020-08-25 |