Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846882 | System and method of dimensional calibration for an analytical microscope | Francis J. Deck, Alan Ronemus, William Robert Keefe | 2020-11-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846882 | System and method of dimensional calibration for an analytical microscope | Francis J. Deck, Alan Ronemus, William Robert Keefe | 2020-11-24 |